Automatic Wafer Probers
In combination with measuring instruments, Auto (Frame) Probers are used for parametric testing of individual integrated circuits at wafer or sample level. The device should be suitable at least for testing micrometer-thin (a few hundred) to millimetre-thick samples or wafers of 200 mm and 300 mm diameter and for probing dies on wafer frames (for 300 mm wafers on dicing frames).
Supply and commissioning of Automatic Wafer Probers for normal wafer probing
01/07/2025
4 YEAR
(price) : Zie bestek See Tender documents
BE242
BEL
Zie Selectieleidraad See Selection Guideline
Supply and commissioning of automatic Wafer Probers for Waferframe probing
(price) : Zie Bestek See Tender document
BE242
BEL
Zie selectieleidraad See Selection guideline
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