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Automatic Wafer Probers

Imec EU Pilot line NV
07/02/2025
Section I: Contracting authority
Imec EU Pilot line NV

Kapeldreef 75, 3001 Heverlee, Belgium
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Section II: Object
0b17aaad-b3eb-45d7-83ee-59f909cb6159
F02

Automatic Wafer Probers
In combination with measuring instruments, Auto (Frame) Probers are used for parametric testing of individual integrated circuits at wafer or sample level. The device should be suitable at least for testing micrometer-thin (a few hundred) to millimetre-thick samples or wafers of 200 mm and 300 mm diameter and for probing dies on wafer frames (for 300 mm wafers on dicing frames).
Supply and commissioning of Automatic Wafer Probers for normal wafer probing


01/07/2025
4 YEAR
  • (price) :
    Zie bestek
    See Tender documents
BE242 BEL

  • Zie Selectieleidraad
    See Selection Guideline
Supply and commissioning of automatic Wafer Probers for Waferframe probing


  • (price) :
    Zie Bestek
    See Tender document
BE242 BEL

  • Zie selectieleidraad
    See Selection guideline
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